An automatic control and timing unit for a time-of-flight mass spectrometer
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering,General Materials Science,Instrumentation
Link
http://stacks.iop.org/0022-3735/16/i=12/a=025/pdf
Reference7 articles.
1. A 10 nsec Resolution Counter for Multiparticle Atom Probe Time‐of‐Flight Measurements
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1. Atom-probe field ion microscopy;Mikrochimica Acta;1992-05
2. Surface analysis of dielectric films by time-of-flight—secondary ion mass spectrometry;Vacuum;1992-05
3. A combined time-of-flight spectrometer using field desorption and ion impact sputtering;Surface Science;1992-04
4. The renaissance of time-of-flight mass spectrometry;International Journal of Mass Spectrometry and Ion Processes;1990-10
5. Measurement of the charge state distribution of field evaporated ions originating from alloys;Surface Science;1985-08
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