A differentially pumped low‐energy ion beam system for an ultrahigh‐vacuum atom‐probe field‐ion microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1135998
Reference16 articles.
1. See, for example, J. Nucl. Mater. 53 (1974); JNUMAM0022-3115
2. 76 and 77 (1978).JNUMAM0022-3115, J. Nucl. Mater.
3. Range Profiles of 300- and 475-eVHe+4Ions and the Diffusivity ofHe4in Tungsten
4. The Atom‐Probe Field Ion Microscope
5. Simplified method for the calibration of an atom‐probe field‐ion microscope
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A miniature electron‐beam evaporator for an ultrahigh‐vacuum atom‐probe field‐ion microscope;Review of Scientific Instruments;1990-12
2. An atom‐probe field‐ion microscope study of 200‐eV1H+2ions implanted in tungsten at 29 K;Journal of Applied Physics;1984-09-15
3. Diffusivity of3He atoms in perfect tungsten crystals;Journal of Applied Physics;1984-08-15
4. The application of TEM to the study of helium cluster nucleation and growth in molybdenum at 300 K;Radiation Effects;1983-01
5. Experimental determination of the particle reflection coefficients of low‐energy (100–1500 eV)3He and4He atoms from the (110) plane of tungsten;Journal of Applied Physics;1981-11
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