EFFECT OF FIELD-EVAPORATION RATE ON QUANTITATIVE ATOM-PROBE ANALYSIS-Reference-Cited by-同舟云学术

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EFFECT OF FIELD-EVAPORATION RATE ON QUANTITATIVE ATOM-PROBE ANALYSIS

Published:1986-03 Issue:C2 Volume:47 Page:C2-415-C2-424
ISSN:0449-1947
Container-title:Le Journal de Physique Colloques
language:
Short-container-title:J. Phys. Colloques

Author:

WAGNER A.,SEIDMAN D. N.

Publisher

EDP Sciences

Subject

General Engineering

Link

http://jphyscol.journaldephysique.org/10.1051/jphyscol:1986264/pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Core–shell nanoscale precipitates in Al–0.06 at.% Sc microalloyed with Tb, Ho, Tm or Lu;Acta Materialia;2010-01

2. On the structure and chemistry of Ni3Al on an atomic scale via atom-probe field-ion microscopy;Applied Surface Science;1995-09

3. Automatic temperature‐controlled helium‐vapor cryostat for atom‐probe field‐ion microscopy studies;Review of Scientific Instruments;1995-07

4. New time‐of‐flight electronics for atom‐probe field‐ion microscopy;Review of Scientific Instruments;1994-06

5. Reply to comment by H. Numakura: On the quantitative analysis of nanometer diameter MgO precipitates via atom-probe field-ion microscopy;Scripta Metallurgica et Materialia;1994-03

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