Automatic temperature‐controlled helium‐vapor cryostat for atom‐probe field‐ion microscopy studies
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145436
Reference18 articles.
1. The Atom‐Probe Field Ion Microscope
2. ON THE IONIZATION STATE OF FIELD EVAPORATED ATOMS AS MEASURED IN THE FIM‐ATOM PROBE
3. A computer-controlled time-of-flight atom-probe field-ion microscope for the study of defects in metals
4. Time aberrations of uniform fields: An improved reflectron mass spectrometer for an atom‐probe field‐ion microscope
5. The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale
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3. Atomic-scale structure and chemistry of ceramic/metal interfaces—II. Solute segregation at MgO/Cu (Ag) and CdO/Ag (Au) interfaces;Acta Materialia;1999-11
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5. Atomic-scale studies of silver segregation at heterophase interfaces;Applied Surface Science;1996-03
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