New time‐of‐flight electronics for atom‐probe field‐ion microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144798
Reference24 articles.
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5. The quantitative compositional analysis and field-evaporation behavior of ordered Ni4Mo on an atomic plane-by-plane basis: An atom-probe field-ion microscope study
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1. A field-programmable-gate-array based time digitizer for the time-of-flight mass spectrometry;Review of Scientific Instruments;2014-04
2. Subnanoscale Studies of Segregation at Grain Boundaries: Simulations and Experiments;Annual Review of Materials Research;2002-08
3. Atomic-scale structure and chemistry of ceramic/metal interfaces—II. Solute segregation at MgO/Cu (Ag) and CdO/Ag (Au) interfaces;Acta Materialia;1999-11
4. Subnanometer scale study of segregation at grain boundaries in an Fe(Si) alloy;Acta Materialia;1998-11
5. Atomic-scale studies of silver segregation at heterophase interfaces;Applied Surface Science;1996-03
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