A circular arc bending model of piezoelectric tube scanners
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1146934
Reference4 articles.
1. Compact, high‐stability, ‘‘thimble‐size’’ scanning tunneling microscope
2. In situ measurement of large piezoelectric displacements in resonant atomic force microscopy
3. Hysteresis correction of scanning tunneling microscope images
4. Distortion‐free, calibrated LiNbO3 piezoscanner for probe microscopes with atomic resolution
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1. Artifacts in AFM;Atomic Force Microscopy;2019
2. Technical Aspects of Atomic Force Microscopy;Atomic Force Microscopy;2019
3. Three-dimensional displacement analysis of a piezoelectric tube scanner through finite element simulations of a tube assembly;Review of Scientific Instruments;2006-11
4. System errors quantitative analysis of sample-scanning AFM;Ultramicroscopy;2005-11
5. Three-dimensional displacements of a piezoelectric tube scanner;Review of Scientific Instruments;1998-01
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