Technical Aspects of Atomic Force Microscopy
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-030-13654-3_3
Reference8 articles.
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3. K.G. Vandervoort, R.K. Zasadzinski, G.G. Galicia, G.W. Crabtree, Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT-5A for use in scanning tunneling microscopes. Rev. Sci. Instrum. 64, 896 (1994). https://doi.org/10.1063/1.1144139
4. C. Wei, A circular arc bending model of piezoelectric tube scanners. Rev. Sci. Instrum. 67, 2286 (1998). https://doi.org/10.1063/1.1146934
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