Full temperature calibration from 4 to 300 K of the voltage response of piezoelectric tube scanner PZT‐5A for use in scanning tunneling microscopes
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1144139
Reference20 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Easy method to characterize a piezoelectric ceramic tube as a displacer
3. A vertical piezoelectric inertial slider
4. A vertical piezoelectric inertial slider
5. Scanning tunneling microscope for low temperature, high magnetic field, and spatially resolved spectroscopy
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