Distortion‐free, calibrated LiNbO3 piezoscanner for probe microscopes with atomic resolution-Reference-Cited by-同舟云学术

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Distortion‐free, calibrated LiNbO3 piezoscanner for probe microscopes with atomic resolution

Published:1993-12 Issue:12 Volume:64 Page:3534-3537
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Heider U.,Weis O.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1144279

Reference10 articles.

1. The Topografiner: An Instrument for Measuring Surface Microtopography

2. Surface Studies by Scanning Tunneling Microscopy

3. Wide-range, low-operating-voltage, bimorph STM: Application as potentiometer

4. Single‐tube three‐dimensional scanner for scanning tunneling microscopy

5. Dynamics of piezoelectric tube scanners for scanning probe microscopy

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1. Physics of Peptide Nanostructures and Their Nanotechnology Applications;Peptide Materials;2013-03-27

2. Strong Piezoelectricity in Bioinspired Peptide Nanotubes;ACS Nano;2010-02-04

3. The Behavior of Piezoelectric Actuators and the Effect on Step-Height Measurement with Scanning Force Microscopes;Nanoscale Calibration Standards and Methods;2006-03-31

4. Near-field optical microscopy;La Rivista del Nuovo Cimento;2000-04

5. Highly resolved atomic (111) surfaces of synthetic type IIb diamond in air investigated by scanning tunneling microscopy using a lithium niobate scanner;Surface Science;1997-07

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