In situ measurement of large piezoelectric displacements in resonant atomic force microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1145566
Reference15 articles.
1. Atomic Force Microscope
2. Atomic Resolution with Atomic Force Microscope
3. Calibration and characterization of piezoelectric elements as used in scanning tunneling microscopy
4. Comparison of Atomic Force Microscopy and Nanoscale Optical Microscopy for Measuring Step Heights
5. Imaging entire genetically functional DNA molecules with the scanning tunneling microscope
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3. Self-manifestation and universal correction of image distortion in scanning tunneling microscopy with spiral scan;Review of Scientific Instruments;2010-07
4. The Behavior of Piezoelectric Actuators and the Effect on Step-Height Measurement with Scanning Force Microscopes;Nanoscale Calibration Standards and Methods;2006-03-31
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