Calibration and characterization of piezoelectric elements as used in scanning tunneling microscopy
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1141989
Reference6 articles.
1. Easy method to characterize a piezoelectric ceramic tube as a displacer
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4. Tunneling microscopy, lithography, and surface diffusion on an easily prepared, atomically flat gold surface
5. The behavior and calibration of some piezoelectric ceramics used in the STM
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