Comparison of Atomic Force Microscopy and Nanoscale Optical Microscopy for Measuring Step Heights-Reference-Cited by-同舟云学术

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Comparison of Atomic Force Microscopy and Nanoscale Optical Microscopy for Measuring Step Heights

Published:1993-03-30 Issue:Part 1, No. 3B Volume:32 Page:1478-1479
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:en
Short-container-title:Jpn. J. Appl. Phys.

Author:

Komatsu Hiroshi,Miyashita Satoru

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quasi-Liquid Layers Can Exist on Polycrystalline Ice Thin Films at a Temperature Significantly Lower than on Ice Single Crystals;Crystal Growth & Design;2018-11-30

2. Interference Phenomena Observed on an Atomic Force Microscope Cantilever by Laser Confocal Microscopy;Japanese Journal of Applied Physics;2011-08-22

3. Interference Phenomena Observed on an Atomic Force Microscope Cantilever by Laser Confocal Microscopy;Japanese Journal of Applied Physics;2011-08-01

4. Comparison of Different Experimental Techniques for the Measurement of Crystal Growth Kinetics;Crystal Growth & Design;2008-11-11

5. In situ observation of elementary growth steps on the surface of protein crystals by laser confocal microscopy;Journal of Crystal Growth;2004-02

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