Kinematical x‐ray diffraction model with a new boundary condition for analysis of Bragg‐peak profiles of layered crystals
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.348844
Reference34 articles.
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4. Sensitivity of X-ray diffractometry for strain depth profiling in III–V heterostructures
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