X-ray double-crystal diffractometry of Ga1−xAlxAs epitaxial layers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference33 articles.
1. Thermal Expansion of AlAs
2. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs
3. Asymmetry of misfit dislocations in heteroepitaxial layers on (001) GaAs substrates
4. Lattice mismatch at the interface in GaP-GaP and GaAIAs-GaAs epitaxial growth
5. X-ray study of AlxGa1−xAs epitaxial layers
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