Improved assessment of structural properties ofAlxGa1−xAs/GaAs heterostructures and superlattices by double-crystal x-ray diffraction
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.33.5565/fulltext
Reference28 articles.
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2. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs
3. X-ray double-crystal diffractometry of Ga1−xAlxAs epitaxial layers
4. Dosage de l'aluminium par spectrometrie d'absorption atomique et diffraction des rayons X dans des couches epitaxiees par jets moleculaires de Ga1− xAlxAs
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