Investigation of the compositional depth profile in epitaxial submicrometer layers ofAIIIBVheterostructures
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Published:1988-10-01
Issue:5
Volume:21
Page:386-392
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ISSN:0021-8898
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Container-title:Journal of Applied Crystallography
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language:
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Short-container-title:J Appl Cryst
Author:
Baumbach T.,Brühl H.-G.,Rhan H.,Pietsch U.
Publisher
International Union of Crystallography (IUCr)
Subject
General Biochemistry, Genetics and Molecular Biology
Cited by
24 articles.
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1. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06
2. Useful formulae;Dynamical Theory of X-Ray Diffraction;2003-11-06
3. Dedication;Dynamical Theory of X-Ray Diffraction;2003-11-06
4. Preface;Dynamical Theory of X-Ray Diffraction;2003-11-06
5. Copyright Page;Dynamical Theory of X-Ray Diffraction;2003-11-06