Note: Double-hole cantilevers for harmonic atomic force microscopy
Author:
Affiliation:
1. Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027, China
Funder
National Natural Science Foundation of China (NSFC)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4991073
Reference13 articles.
1. Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic-force microscopy
2. High-resolution imaging of elastic properties using harmonic cantilevers
3. Multi-eigenmode control for high material contrast in bimodal and higher harmonic atomic force microscopy
4. Higher Harmonic Atomic Force Microscopy: Imaging of Biological Membranes in Liquid
5. Concentrated-mass cantilever enhances multiple harmonics in tapping-mode atomic force microscopy
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1. Tuning the flexural frequency of overhang-/T-shaped microcantilevers for high harmonics;Japanese Journal of Applied Physics;2023-10-01
2. Design of V-shaped cantilevers for enhanced multifrequency AFM measurements;Beilstein Journal of Nanotechnology;2020-10-06
3. Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing;Ultramicroscopy;2019-12
4. Biharmonic versus bimodal AFM: Numerical and experimental study on soft matter;Journal of Applied Physics;2019-09-07
5. An optimized harmonic probe with tailored resonant mode for multifrequency atomic force microscopy;Advances in Mechanical Engineering;2018-11
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