Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing-Reference-Cited by-同舟云学术

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Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensing

Published:2019-12 Issue: Volume:207 Page:112832
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Zhang Weijie,Chen Yuhang,Hou Yaoping,Wang Wenting,Liu Huarong,Zheng Lei

Funder

National Natural Science Foundation of China

Anhui Major Scientific Instruments Development Project

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference56 articles.

1. Nanoscale subsurface imaging

2. Surface and subsurface morphology of operating nanowire:fullerene solar cells revealed by photoconductive-AFM

3. Three-dimensional imaging of polymer materials by Scanning Probe Tomography

4. From surface to intracellular non-invasive nanoscale study of living cells impairments

5. Fast, exact and non-destructive diagnoses of contact failures in nano-scale semiconductor device using conductive AFM

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1. Accurate detection of subsurface microcavity by bimodal atomic force microscopy;Nanotechnology;2024-06-13

2. Imaging beyond the surface region: Probing hidden materials via atomic force microscopy;Science Advances;2023-06-30

3. Characterization of Cell Response on Patterned Stiffness Substrate by AFAM;2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO);2022-08-08

4. Tomographic imaging using conductive atomic force microscopy;Materials Characterization;2022-04

5. Best practices and recommendations for accurate nanomechanical characterization of heterogeneous polymer systems with atomic force microscopy;Progress in Polymer Science;2021-08

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