Current-induced degradation of high performance deep ultraviolet light emitting diodes-Reference-Cited by-同舟云学术

Current-induced degradation of high performance deep ultraviolet light emitting diodes

Published:2010-05-24 Issue:21 Volume:96 Page:213512
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Moe Craig G.,Reed Meredith L.,Garrett Gregory A.,Sampath Anand V.,Alexander Troy,Shen Hongen,Wraback Michael,Bilenko Yuriy,Shatalov Maxim,Yang Jinwei,Sun Wenhong,Deng Jianyu,Gaska Remis

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3435485

Reference16 articles.

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2. A. Khan, S. Hwang, J. Lowder, V. Adivarahan, and Q. Fareed, Proceedings of the International Reliability Physics Symposium (IEEE, New York, 2009), Vol. 47, p. 89.

3. High-efficiency AlGaN-based UV light-emitting diode on laterally overgrown AlN

4. Increased power from deep ultraviolet LEDs via precursor selection

5. Optical power degradation mechanisms in AlGaN-based 280nm deep ultraviolet light-emitting diodes on sapphire

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