Dynamic input capacitance of single-electron transistors and the effect on charge-sensitive electrometers
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.373580
Reference6 articles.
1. Recent results and future challenges for the NIST charged-capacitor experiment
2. Measuring the electrons charge and the fine-structure constant by counting electrons on a capacitor
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5. Modulation of the charge of a single-electron transistor by distant defects
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3. Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications;Applied Sciences;2020-12-09
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