Investigating the origin of efficiency droop by profiling the temperature across the multi-quantum well of an operating light-emitting diode-Reference-Cited by-同舟云学术

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Investigating the origin of efficiency droop by profiling the temperature across the multi-quantum well of an operating light-emitting diode

Published:2015-01-26 Issue:4 Volume:106 Page:041114
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Jung Euihan¹,Hwang Gwangseok¹,Chung Jaehun¹,Kwon Ohmyoung¹²,Han Jaecheon²³,Moon Yong-Tae³,Seong Tae-Yeon²⁴

Affiliation:

1. Department of Mechanical Engineering, Korea University, Seoul 136-701, South Korea

2. Department of Nanophotonics, Korea University, Seoul 136-713, South Korea

3. LG Innotek Ltd., Paju City, Gyeonggi Province 413-901, South Korea

4. Department of Materials Science and Engineering, Korea University, Seoul 136-713, South Korea

Funder

LG Innotek Co., Ltd.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4907177

Reference19 articles.

1. Solid-state lighting: an energy-economics perspective

2. Characteristics of InGaN-Based UV/Blue/Green/Amber/Red Light-Emitting Diodes

3. Investigation of the Nonthermal Mechanism of Efficiency Rolloff in InGaN Light-Emitting Diodes

4. Effect of the joule heating on the quantum efficiency and choice of thermal conditions for high-power blue InGaN/GaN LEDs

5. Internal quantum efficiency and nonradiative recombination coefficient of GaInN/GaN multiple quantum wells with different dislocation densities

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1. Quantitative nanoscale temperature mapping across the multi-quantum well of a light-emitting diode in operation using vacuum null-point scanning thermal microscopy to evaluate local energy conversion efficiency;RSC Advances;2023

2. Nanoscale thermometry under ambient conditions via scanning thermal microscopy with 3D scanning differential method;Review of Scientific Instruments;2022-11-01

3. Vacuum null-point scanning thermal microscopy: Simultaneous quantitative nanoscale mapping of undisturbed temperature and thermal resistance;International Journal of Thermal Sciences;2022-02

4. Efficiency Boosting by Thermal Harvesting in InGaN/GaN Light-Emitting Diodes;Frontiers in Physics;2021-09-09

5. Quantifying thermal transport in buried semiconductor nanostructures via cross-sectional scanning thermal microscopy;Nanoscale;2021

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