Quantitative nanoscale temperature mapping across the multi-quantum well of a light-emitting diode in operation using vacuum null-point scanning thermal microscopy to evaluate local energy conversion efficiency-Reference-Cited by-同舟云学术

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Quantitative nanoscale temperature mapping across the multi-quantum well of a light-emitting diode in operation using vacuum null-point scanning thermal microscopy to evaluate local energy conversion efficiency

Published:2023 Issue:48 Volume:13 Page:34230-34238
ISSN:2046-2069
Container-title:RSC Advances
language:en
Short-container-title:RSC Adv.

Author:

Shin Hwijong¹,Liu Seosi¹,Kwon Ohmyoung¹^ORCID

Affiliation:

1. School of Mechanical Engineering, Korea University, Seoul 136-701, South Korea

Abstract

Temperature was quantitatively measured despite intense local light from MQW using VNP SThM. Temperature peak across the MQW shifts with change in injection current. VNP SThM can analyze local energy conversion efficiency of nanophotonic devices.

Funder

Ministry of Education, Science and Technology

Publisher

Royal Society of Chemistry (RSC)

Subject

General Chemical Engineering,General Chemistry

Link

http://pubs.rsc.org/en/content/articlepdf/2023/RA/D3RA06062D

Reference33 articles.

1. Illumination with solid state lighting technology

2. LEDs for Solid-State Lighting: Performance Challenges and Recent Advances

3. Prospects for LED lighting

4. The emergence and prospects of deep-ultraviolet light-emitting diode technologies

5. Mini-LED and Micro-LED: Promising Candidates for the Next Generation Display Technology

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