Metal‐Semiconductor Barrier‐Height Measurement by the Differential Capacitance Method—Degenerate One‐Carrier System
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1713221
Reference9 articles.
1. Vereinfachte und erweiterte Theorie der Randschicht-gleichrichter
2. The Charge and Potential Distributions at the Zinc Oxide Electrode
3. Accurate solution of an idealized one-carrier metal-semiconductor junction problem
4. Metal—Semiconductor Barrier Height Measurement by the Differential Capacitance Method—One Carrier System
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