Capacitance methodology for investigating defect states in energy gap of organic semiconductor-Reference-Cited by-同舟云学术

Capacitance methodology for investigating defect states in energy gap of organic semiconductor

Published:2019-02 Issue: Volume:65 Page:275-299
ISSN:1566-1199
Container-title:Organic Electronics
language:en
Short-container-title:Organic Electronics

Author:

Pang Hu-Sheng,Xu Hui,Tang Chao,Meng Ling-Kun,Ding Yan,Xiao Jing,Liu Rui-Lan,Pang Zong-Qiang,Huang Wei

Funder

The National Basic Research Program of China

Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM)

Synergetic Innovation Center for Organic Electronics and Information Displays

National Natural Science Foundation of China

Natural Science Foundation of Nanjing University of Posts and Telecommunications

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Materials Chemistry,Condensed Matter Physics,General Chemistry,Biomaterials,Electronic, Optical and Magnetic Materials

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