Nature of Defect States within Amorphous NPB Investigated through Drive-Level Capacitance Profiling-Reference-Cited by-同舟云学术

Nature of Defect States within Amorphous NPB Investigated through Drive-Level Capacitance Profiling

Published:2018-12-10 Issue:1 Volume:123 Page:165-174
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Pang Hu-Sheng¹,Xu Hui¹,Tang Chao¹^ORCID,Meng Ling-Kun¹,Ding Yan¹,Cai Hai-Tong¹,Xiao Jing¹²,Liu Rui-Lan¹,Zeng Wen-Qing³,Huang Wei¹

Affiliation:

1. Key Laboratory for Organic Electronics and Information Displays & Institute of Advanced Materials (IAM), Jiangsu National Synergetic Innovation Center for Advanced Materials (SICAM), Nanjing University of Posts & Telecommunications, 9 Wenyuan Road, Nanjing 210023, China

2. College of Physics and Electronic Engineering, Taishan University, 525 Dongyue Road, Taian 271021, China

3. The Second Affiliated Hospital of Zhejiang Chinese Medical University, 318 Chaowang Road, Hangzhou 310005, Zhejiang China

Funder

Ministry of Science and Technology of the People's Republic of China

National Natural Science Foundation of China

Natural Science Foundation, Nanjing University of Posts and Telecommunications

Synergetic Innovation Center for Organic Electronics and Information Displays, Nanjing University of Posts and Telecommunications

Jiangsu National Synergetic Innovation Center for Advanced Materials

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpcc.8b09770

Reference71 articles.

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