Significant reduction in the soft error susceptibility of GaAs field‐effect transistors with a low‐temperature grown GaAs buffer layer
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.115280
Reference22 articles.
Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
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3. Structural study of low-temperature grown superlattices of GaAs with delta-layers of Sb and P;Physica B: Condensed Matter;2009-12
4. High-resolution X-ray diffraction studies of the GaAs structures grown at a low temperature and periodically δ-doped with antimony and phosphorus;Semiconductors;2009-08
5. SINGLE-EVENT EFFECTS IN III-V SEMICONDUCTOR ELECTRONICS;International Journal of High Speed Electronics and Systems;2004-06
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