Reliability characteristics of NiSi nanocrystals embedded in oxide and nitride layers for nonvolatile memory application
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2905812
Reference9 articles.
1. Nanocrystal nonvolatile memory devices
2. Formation of stacked Ni silicide nanocrystals for nonvolatile memory application
3. Room-temperature quantum effect in silicon nanoparticles obtained by low-energy ion implantation and embedded in a nanometer scale capacitor
4. Nonvolatile Flash Memory Device Using Ge Nanocrystals Embedded in HfAlO High-<tex>$kappa$</tex>Tunneling and Control Oxides: Device Fabrication and Electrical Performance
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