Abnormal threshold voltage shift under hot carrier stress in Ti1−xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Abnormal threshold voltage shift under hot carrier stress in Ti1−xNx/HfO2 p-channel metal-oxide-semiconductor field-effect transistors

Published:2013-09-28 Issue:12 Volume:114 Page:124505
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Tsai Jyun-Yu,Chang Ting-Chang,Lo Wen-Hung,Ho Szu-Han,Chen Ching-En,Chen Hua-Mao,Tseng Tseung-Yuen,Tai Ya-Hsiang,Cheng Osbert,Huang Cheng-Tung

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4822158

Reference24 articles.

1. Developments in nanocrystal memory

2. Influence of electrode material on the resistive memory switching property of indium gallium zinc oxide thin films

3. Redox Reaction Switching Mechanism in RRAM Device With $\hbox{Pt/CoSiO}_{X}\hbox{/}\hbox{TiN}$ Structure

4. Influence of positive bias stress on N2O plasma improved InGaZnO thin film transistor

5. Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Suppressing Drain-Induced Barrier Lowering and Kink Effect in Low-Temperature Poly-Si TFTs Using a Partitioned Light Shield;IEEE Electron Device Letters;2022-04

2. Abnormal ${C}$ –${V}$ Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTs;IEEE Transactions on Electron Devices;2019-11

3. Physical and chemical mechanisms in oxide-based resistance random access memory;Nanoscale Research Letters;2015-03-12

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3