Repeatable and reproducible formation/rupture of oxygen vacancy filaments in the vicinity of a polycrystalline HfO2 surface-Reference-Cited by-同舟云学术

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Repeatable and reproducible formation/rupture of oxygen vacancy filaments in the vicinity of a polycrystalline HfO2 surface

Published:2019-03 Issue:3 Volume:9 Page:035309
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Hida Sota¹²³,Morita Takumi¹³,Yamasaki Takahiro³,Nara Jun³,Ohno Takahisa³,Kinoshita Kentaro¹

Affiliation:

1. Faculty of Science, Tokyo University of Science, Nijuku 6-3-1, Katsushika, Tokyo 125-8585, Japan

2. Graduate School of Sustainability Science, Tottori University, Koyama-Minami 4-101, Tottori 680-8552, Japan

3. National Institute for Materials Science, Namiki 1-1, Tsukuba, Ibaraki 305-0044, Japan

Funder

Nippon Sheet Glass Foundation for Materials Science and Engineering

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5085443

Reference31 articles.

1. Thermal stability and electrical characteristics of ultrathin hafnium oxide gate dielectric reoxidized with rapid thermal annealing

2. Interface engineering and chemistry of Hf-based high-k dielectrics on III–V substrates

3. Modulating the Interface Quality and Electrical Properties of HfTiO/InGaAs Gate Stack by Atomic-Layer-Deposition-Derived Al2O3 Passivation Layer

4. On the scaling issues and high-κ replacement of ultrathin gate dielectrics for nanoscale MOS transistors

5. Evidences of oxygen-mediated resistive-switching mechanism in TiN\HfO2\Pt cells

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Exploring the direction-dependency of conductive filament formation and oxygen vacancy migration behaviors in HfO₂-based RRAM;Physical Chemistry Chemical Physics;2023

2. A study on the diffusion properties of oxygen in Al and W-doped λ-Ta2O5;AIP Advances;2021-12-01

3. Optical rectification in a reconfigurable resistive switching filament;Applied Physics Letters;2019-07-22

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