Electrically detected magnetic resonance of carbon dangling bonds at the Si-face 4H-SiC/SiO2 interface-Reference-Cited by-同舟云学术

Electrically detected magnetic resonance of carbon dangling bonds at the Si-face 4H-SiC/SiO2 interface

Author:

Gruber G.¹,Cottom J.²,Meszaros R.³,Koch M.⁴^ORCID,Pobegen G.⁵^ORCID,Aichinger T.³,Peters D.⁶,Hadley P.¹^ORCID

Affiliation:

1. Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, 8010 Graz, Austria

2. Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT, United Kingdom

3. Infineon Technologies, Siemensstraße 2, 9500 Villach, Austria

4. Institute of Experimental Physics, Graz University of Technology, Petersgasse 16, 8010 Graz, Austria

5. KAI GmbH, Europastraße 8, 9500 Villach, Austria

6. Infineon Technologies, Schottkystraße 10, 91058 Erlangen, Germany

Funder

Kärntner Wirtschaftsförderungsfonds

Österreichische Forschungsförderungsgesellschaft

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

Reference35 articles.

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