Evidence of a ternary Co1−xFexSi2 phase with a CaF2-type structure: High-resolution transmission electron microscopy and diffraction anomalous fine structure study-Reference-Cited by-同舟云学术

Evidence of a ternary Co1−xFexSi2 phase with a CaF2-type structure: High-resolution transmission electron microscopy and diffraction anomalous fine structure study

Published:2002-09-23 Issue:13 Volume:81 Page:2346-2348
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Ersen O.,Ulhaq-Bouillet C.,Pierron-Bohnes V.,Tuilier M. H.,Berling D.,Bertoncini P.,Pirri C.,Gailhanou M.,Thiaudière D.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1506182

Reference15 articles.

1. Structural and electronic properties of metastable epitaxialFeSi1+xfilms on Si(111)

2. Formation of Epitaxial CsCl-Type Iron Silicide on Si(111)

3. Epitaxial Growth of α-FeSi 2 on Si(111) at Low Temperature

4. Sequential‐ion‐implantation synthesis of ternary metal silicides

5. Ion beam synthesis of ternary phase CoFe‐silicide in (111) silicon

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