Study of the substrate bias in plasma depositions using an electron cyclotron resonance plasma
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.346217
Reference25 articles.
1. Ion energy analysis for sputtering‐type electron‐cyclotron‐resonance microwave plasma
2. Sur quelques facteurs intervenant dans le bombardement de couches pulvérisées
3. Very‐low‐pressure deposition by electron cyclotron resonance plasma chemical vapor deposition method
4. Very‐low‐pressure deposition by electron cyclotron resonance plasma chemical vapor deposition method
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