The interaction of oxygen vacancies with grain boundaries in monoclinic HfO2
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3271184
Reference16 articles.
1. Tunneling atomic-force microscopy as a highly sensitive mapping tool for the characterization of film morphology in thin high-k dielectrics
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4. Redox-Based Resistive Switching Memories - Nanoionic Mechanisms, Prospects, and Challenges
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