In-situ transport and microstructural evolution in GaN Schottky diodes and epilayers exposed to swift heavy ion irradiation

Author:

Kumar Ashish1ORCID,Singh R.2,Kumar Parmod1ORCID,Singh Udai B.1ORCID,Asokan K.1,Karaseov Platon A.3ORCID,Titov Andrei I.3ORCID,Kanjilal D.1ORCID

Affiliation:

1. Inter-University Accelerator Centre, Aruna Asaf Ali Marg, Vasant Kunj, New Delhi 110067, India

2. Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India

3. Department of Physical Electronics, Peter the Great St. Petersburg Polytechnic University, Polytechnicheskaya st., 29, Saint Petersburg, Russia

Funder

Department of Science and Technology, Ministry of Science and Technology

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 18 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Study on the electrical performance degradation mechanism of β -Ga2O3 p-n diode under heavy ion radiation;Applied Physics Letters;2024-09-09

2. Effects of 300-MeV Proton Irradiation on Electrical Properties of β-Ga2O3 Schottky Barrier Diodes;IEEE Transactions on Electron Devices;2024-08

3. Influence of 700 keV O 3+ ion implantation on current transport properties of Cr/p-GaN SBD’s;Radiation Effects and Defects in Solids;2024-07-16

4. Ion-induced transformation of shallow defects into deep-level defects in GaN epilayers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-07

5. Disorder induced in GaN thin films by 200 MeV silver ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2024-06

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