Comparison of image properties in full-field phase X-ray microscopes based on grating interferometry and Zernike's phase contrast optics
Author:
Affiliation:
1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577, Japan
2. Carl Zeiss X-ray Microscopy, Inc., 4385 Hopyard Road, Suite 100, Pleasanton, California 94588, USA
Funder
Japan Science and Technology Agency
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5039676
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