50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors-Reference-Cited by-同舟云学术

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50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors

Published:2017-04-13 Issue:1 Volume:7 Page:
ISSN:2045-2322
Container-title:Scientific Reports
language:en
Short-container-title:Sci Rep

Author:

Matsuyama Satoshi,Yasuda Shuhei,Yamada Jumpei,Okada Hiromi,Kohmura Yoshiki,Yabashi Makina,Ishikawa Tetsuya,Yamauchi Kazuto

Publisher

Springer Science and Business Media LLC

Subject

Multidisciplinary

Link

http://www.nature.com/articles/srep46358.pdf

Reference33 articles.

1. Hocke, R. Micrographia: or, Some physiological descriptions of minute bodies made by magnifying glasses (London: J. Martyn and J. Allestry, 1665).

2. Takahashi, Y. et al. High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam. Phys. Rev. B 80, 054103 (2009).

3. Vila-Comamala, J. et al. Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging. Opt. Express 19, 21333 (2011).

4. Mimura, H. et al. Breaking the 10 nm barrier in hard-X-ray focusing. Nature Physics 6, 122–125 (2010).

5. Yamauchi, K. et al. Single-nanometer focusing of hard x-rays by Kirkpatrick-Baez mirrors. J. Phys. Condens. Matter 23, 394206 (2011).

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