Development of grating-based super-resolution x-ray phase imaging-Reference-Cited by-同舟云学术

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Development of grating-based super-resolution x-ray phase imaging

Published:2023 Issue: Volume: Page:
ISSN:0094-243X
Container-title:PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY – XRM2022
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Author:

Momose Atsushi,Zhao Zhuoxuan,Ueda Ryosuke,Cai Mingjian,Takano Hidekazu,Wu Yanlin,Ikematsu Katsumasa,Kawakami Hiroki,Zangi Pouria,Meyer Pascal,Börner Martin,Schulz Joachim

Publisher

AIP Publishing

Link

http://aip.scitation.org/doi/pdf/10.1063/5.0168794

Reference21 articles.

1. Demonstration of X-Ray Talbot Interferometry

2. X-ray phase imaging with a grating interferometer

3. Phase Tomography by X-ray Talbot Interferometry for Biological Imaging

4. High aspect ratio gratings for X-ray phase contrast imaging

5. P. Meyer and J. Schulz, “Deep X-ray lithography” in Micro-Manufacturing Engineering and Technology, Y. Qin, Ed. (Elsevier, Boston, MA, ed. 2, 2015), pp. 365392.

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