Crystalline quality and residual stresses in diamond layers by Raman and x‐ray diffraction analyses
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.359725
Reference25 articles.
1. Properties of diamond membranes for x‐ray lithography
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5. Characterization of diamond films by Raman spectroscopy
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