A topography measurement instrument based on the scanning electron microscope
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1143057
Reference10 articles.
1. Nanometric surface metrology at the National Physical Laboratory
2. High-speed, large-scale imaging with the atomic force microscope
3. Scanning tunneling microscopy: Critical dimension and surface roughness analysis
4. Surface investigations with a combined scanning electron-scanning tunneling microscope
5. An automatic topographical surface reconstruction in the SEM
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