Surface investigations with a combined scanning electron-scanning tunneling microscope-Reference-Cited by-同舟云学术

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Surface investigations with a combined scanning electron-scanning tunneling microscope

Published:1990-05 Issue:3 Volume:12 Page:126-132
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Fuchs H.,Laschinski R.

Funder

Bundesministerium für Forschung und Technologie

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sca.4950120303/fullpdf

Reference24 articles.

1. Anomalous voltage dependence of tunneling microscopy in WSe2;Akari;J Micros,1988

2. Nanometer-scale hole formation on graphite using a scanning tunneling microscope;Albrecht;Appl Phys Lett,1989

3. SEM/STM combination for STM tip guidance;Anders;Ultramicroscopy,1988

4. Ion milled tips for scanning tunneling microscopy;Biegelsen;Appl Phys Lett,1987

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Poly(Alkyl Cyanoacrylate) Nanoparticles for Delivery of Anti-Cancer Drugs;Nanotechnology for Cancer Therapy;2006-12-19

2. SPM Manipulation and Modifications and Their Storage Applications;Applied Scanning Probe Methods;2004

3. Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM);High-Resolution Imaging and Spectrometry of Materials;2003

4. Combination of a Besocke-type scanning tunneling microscope with a scanning electron microscope;Review of Scientific Instruments;2001-09

5. Special Techniques in SEM;Springer Series in Optical Sciences;1998

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