Surface investigations with a combined scanning electron-scanning tunneling microscope

Author:

Fuchs H.,Laschinski R.

Funder

Bundesministerium für Forschung und Technologie

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Cited by 25 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. SPM Manipulation and Modifications and Their Storage Applications;Applied Scanning Probe Methods;2004

3. Scanning Tunneling Microscopy (STM) and Spectroscopy (STS), Atomic Force Microscopy (AFM);High-Resolution Imaging and Spectrometry of Materials;2003

4. Combination of a Besocke-type scanning tunneling microscope with a scanning electron microscope;Review of Scientific Instruments;2001-09

5. Special Techniques in SEM;Springer Series in Optical Sciences;1998

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