1. Height measured from stereo-pair scanning electron micrographs;Boyde;BEDO,1968
2. Boyde A Photogrammetry of stereo-pair SEM images using separate measurements from two images Scanning Electron Microscopy 1974/I IITRI Chicago 101 10
3. Cornefert G An automatic focusing system for resolving height information on the SEM 1975
4. Secondary electron emission;Dekker;Solid State Phys.,1958
5. Eine automatische Fokussierungseinrichtung für Rasterelektronenmikroskope;Hersener;BEDO,1972