A generic topography reconstruction method based on multi‐detector backscattered electron images-Reference-Cited by-同舟云学术

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A generic topography reconstruction method based on multi‐detector backscattered electron images

Published:2022-05-29 Issue:5 Volume:58 Page:
ISSN:0039-2103
Container-title:Strain
language:en
Short-container-title:Strain

Author:

Neggers Jan¹²^ORCID,Héripré Eva¹,Bonnet Marc²,Hallais Simon³,Roux Stéphane²

Affiliation:

1. CentraleSupélec/CNRS/Université Paris‐Saclay, MSSMat Gif‐sur‐Yvette France

2. Université Paris‐Saclay/ENS Paris‐Saclay/CNRS, LMT ‐ Laboratoire de Mécanique et Technologie Gif‐sur‐Yvette France

3. CNRS/École Polytechnique, LMS ‐ Laboratoire de Mécanique et Technologie Palaiseau France

Funder

Agence Nationale de la Recherche

Laboratoire Systèmes et Ingénierie de Paris-Saclay

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/str.12416

Reference26 articles.

1. Surface roughness imparts tensile ductility to nanoscale metallic glasses

2. Build orientation, surface roughness, and scan path influence on the microstructure, mechanical properties, and flexural fatigue behavior of Ti–6Al–4V fabricated by electron beam melting

3. Surface roughness effects on the displacement bursts observed in nanoindentation

4. Advances in atomic force microscopy

5. Photogrammetry with the scanning electron microscope

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