Author:
Chen Gang,Singh Dileep,Eryilmaz Osman,Routbort Jules,Larson Bennett C.,Liu Wenjun
Subject
Physics and Astronomy (miscellaneous)
Reference12 articles.
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3. Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films
4. Stress in hard metal films
5. Method for the simultaneous determination of anisotropic residual stresses and texture by x‐ray diffraction
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