Mesoscale x-ray diffraction measurement of stress relaxation associated with buckling in compressed thin films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1591081
Reference20 articles.
1. Delamination of Compressed Thin Films
2. Stability of Straight Delamination Blisters
3. Undulated blistering during thin film delamination
4. Delamination of metal thin films on polymer substrates: From straight-sided blisters to varicose structures
5. Buckling and post-buckling kinetics of compressed thin films on viscous substrates
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