Probing temperature gradients within the GaN buffer layer of AlGaN/GaN high electron mobility transistors with Raman thermography
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4865296
Reference23 articles.
1. (Invited) Electric-Field and Thermally-Activated Failure Mechanisms of AlGaN/GaN High Electron Mobility Transistors
2. Simultaneous measurement of temperature and thermal stress in AlGaN/GaN high electron mobility transistors using Raman scattering spectroscopy
3. Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives
4. J. Pomeroy, M. Bernardoni, A. Sarua, A. Manoi, D. Dumka, D. Fanning, and M. Kuball, in IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) (IEEE, 2013), pp. 1–4.
5. Temperature distribution in Si-MOSFETs studied by micro-Raman spectroscopy
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