Author:
Aboy Maria,Pelaz Lourdes,Bruno Elena,Mirabella Salvo,Boninelli Simona
Subject
General Physics and Astronomy
Reference39 articles.
1. A. Armigliato, D. Nobili, P. Ostoja, M. Servidori, and S. Solmi, in Semiconductor Silicon 1977, edited by H. Huff and E. Sirtl (The Electrochemical Society, Princeton, NJ, 1977), Vol. 77–2, pp. 638.
2. Transient enhanced diffusion of boron in Si
3. B cluster formation and dissolution in Si: A scenario based on atomistic modeling
4. Atomistic analysis of the evolution of boron activation during annealing in crystalline and preamorphized silicon
5. A comparative study of dopant activation in boron, BF/sub 2/, arsenic, and phosphorus implanted silicon
Cited by
19 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A general scheme for point defect sink strength calculation and related machine-learning-based expressions;International Journal of Plasticity;2024-01
2. Roadmap for focused ion beam technologies;Applied Physics Reviews;2023-12-01
3. Rapid thermal process driven intra-die device variations;Materials Science in Semiconductor Processing;2022-12
4. Atomistic simulations of acceptor removal in p-type Si irradiated with neutrons;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-02
5. Laser-matter interactions;Laser Annealing Processes in Semiconductor Technology;2021