Thermal stability and performance reliability of Pt/Ti/WSi/Ni ohmic contacts ton-SiC for high temperature and pulsed power device applications
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1450024
Reference31 articles.
1. Low resistivity ohmic titanium carbide contacts to n- and p-type 4H-silicon carbide
2. Studies on the reaction of the 5′-phosphorimidazolide of adenosine with Cu(II)-exchanged hectorite
3. Thermal stability and contact degradation mechanisms of TaC ohmic contacts with W/WC overlayers ton-type 6H SiC
4. Pt and PtSixSchottky contacts onn‐type β‐SiC
5. The Effect of Thermal Annealing of Au Contacts on 6h-Sic and 4h-Sic
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