Interface states at the anodized Al2O3-metal interface
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1366653
Reference29 articles.
1. Anomalous Capacitance of Thin Dielectric Structures
2. Investigation of Al2O3 film-thickness by tunnel emission and capacitance measurements
3. Interface contribution to the capacitance of thin‐film Al‐Al2O3‐Al trilayer structures
4. Frequency-dependent interface capacitance of Al–Al2O3–Al tunnel junctions
5. Dielectric and optical properties of ZnS films
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