The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
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Published:2020-05-24
Issue:159
Volume:
Page:
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ISSN:1940-087X
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Container-title:Journal of Visualized Experiments
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language:en
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Short-container-title:JoVE
Author:
Gomes Tiago C.,Kumar Dinesh,Alves Neri,Kettle Jeff,Fugikawa-Santos Lucas
Publisher
MyJove Corporation
Subject
General Immunology and Microbiology,General Biochemistry, Genetics and Molecular Biology,General Chemical Engineering,General Neuroscience