Observation of two atomic configurations for the {12̄10} stacking fault in wurtzite (Ga, Al) nitrides
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.122990
Reference19 articles.
1. InGaN-Based Multi-Quantum-Well-Structure Laser Diodes
2. Large‐band‐gap SiC, III‐V nitride, and II‐VI ZnSe‐based semiconductor device technologies
3. Homoepitaxy of GaN on polished bulk single crystals by metalorganic chemical vapor deposition
4. Initial stage of aluminum nitride film growth on 6H‐silicon carbide by plasma‐assisted, gas‐source molecular beam epitaxy
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